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Wang, Y., Fu, X., Wu, A., Huo, Y., Liu, C., Luan, P., Lei, L., Liang, F. and Li, C. (2023) An advanced calibration method for probe leakage correction in on-wafer test systems. IEEE Transactions on Microwave Theory and Techniques, 71(2), pp. 682-690. (doi: 10.1109/TMTT.2022.3200050)
Li, C. (2022) Advances in Leakage Corrections for On-wafer S-parameter Measurements. European Microwave Week 2022, Milan, Italy, 25-30 Sep 2022.