Advances in Leakage Corrections for On-wafer S-parameter Measurements

Li, C. (2022) Advances in Leakage Corrections for On-wafer S-parameter Measurements. European Microwave Week 2022, Milan, Italy, 25-30 Sep 2022.

Abstract

This talk will review the causes of crosstalk in on-wafer measurements and discuss the conventional error models and recent progress on new 8 term, 12 term and 16 term error models, correction algorithms and the corresponding calibration procedures at millimeter-wave frequencies.

• Item Type: Conference or Workshop Item
• Status: Published
• Refereed: No
• Glasgow Author(s) Enlighten ID: Li, Professor Chong
• Authors: Li, C.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Research Group: Microwave and Terahertz Electronics Group
• Copyright Holders: Copyright © 2022 The Author
• Publisher Policy: Reproduced with the permission of the Author

Related URLs

• Organisation

Project Code	Award No	Project Name	Principal Investigator	Funder's Name	Funder Ref	Lead Dept
313228		On-wafer device and system test cluster for 6 G and THz communications	Edward Wasige	Engineering and Physical Sciences Research Council (EPSRC)	EP/W006448/1	ENG - Electronics & Nanoscale Engineering