Alexander, C., Brown, A., Watling, J. and Asenov, A. (2004) Impact of single charge trapping in nano-MOSFETs. In: IEEE 2004 Silicon Nanoelectronics Workshop, Honolulu,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Charge, Impact, Nano-MOSFETS, Silicon, Trapping |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Brown, Mr Andrew and Alexander, Dr Craig and Watling, Dr Jeremy |
| Authors: | Alexander, C., Brown, A., Watling, J., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IEEE |
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