Effect of Passivation on Selectively Grown Sub-µm Ge-on-Si Single Photon Avalanche Diode Detectors

Coughlan, C., Mirza, M.M. , Kirdoda, J. , Dumas, D., Smith, C., McCarthy, C. , Millar, R.W. and Paul, D.J. (2023) Effect of Passivation on Selectively Grown Sub-µm Ge-on-Si Single Photon Avalanche Diode Detectors. In: 2023 IEEE Silicon Photonics Conference (SiPhotonics), Arlington, VA, USA, 04-07 Apr 2023, ISBN 9781665486552 (doi: 10.1109/SiPhotonics55903.2023.10141911)

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Abstract

Ge-on-SOI (silicon-on-insulator) single photon avalanche diodes (SPADs) have been fabricated with exposed sidewalls allowing variation of passivation techniques. Reduced dark currents and density of surface states are demonstrated with thermal oxide passivation, demonstrating the benefit of optimal passivation of low aspect ratio selectively grown Ge.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McCarthy, Charlie and Mirza, Dr Muhammad M A and Paul, Professor Douglas and Millar, Dr Ross and Dumas, Dr Derek and Coughlan, Conor and Kirdoda, Mr Jaroslaw
Authors: Coughlan, C., Mirza, M.M., Kirdoda, J., Dumas, D., Smith, C., McCarthy, C., Millar, R.W., and Paul, D.J.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISSN:1949-209X
ISBN:9781665486552
Copyright Holders:Copyright © 2023 IEEE
First Published:First published in 2023 IEEE Silicon Photonics Conference (SiPhotonics)
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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