Carrillo-Nunez, H., Lee, J., Berrada, S., Medina-Bailon, C., Adamu-Lema, F., Luisier, M., Asenov, A. and Georgiev, V. P. (2018) Random dopant-induced variability in Si-InAs nanowire tunnel FETs: a quantum transport simulation study. IEEE Electron Device Letters, 39(9), pp. 1473-1476. (doi: 10.1109/LED.2018.2859586)
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Abstract
In this letter, we report a quantum transport simu- lation study of the impact of Random Discrete Dopants (RDD)s on Si-InAs nanowire p-type Tunnel FETs. The band-to-band tunneling is simulated using the non-equilibrium Green’s func- tion formalism in effective mass approximation, implementing a two-band model of the imaginary dispersion. We have found that RDDs induce strong variability not only in the OFF-state but also in the ON-state current of the TFETs. Contrary to the nearly normal distribution of the RDD induced ON-current variations in conventional CMOS transistors, the TFET’s ON- currents variations are described by a logarithmic distribution. The distributions of other Figures of Merit (FoM) such as threshold voltage and subthreshold swing are also reported. The variability in the FoM is analysed by studying the correlation between the number and the position of the dopants.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Carrillo-Nunez, Dr Hamilton and Lee, Mr Jaehyun and Georgiev, Professor Vihar and Asenov, Professor Asen and Medina Bailon, Miss Cristina and Berrada, Dr Salim and Adamu-Lema, Dr Fikru |
| Authors: | Carrillo-Nunez, H., Lee, J., Berrada, S., Medina-Bailon, C., Adamu-Lema, F., Luisier, M., Asenov, A., and Georgiev, V. P. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | IEEE Electron Device Letters |
| Publisher: | IEEE |
| ISSN: | 0741-3106 |
| ISSN (Online): | 1558-0563 |
| Published Online: | 25 July 2018 |
| Copyright Holders: | Copyright © 2018 IEEE |
| First Published: | First published in IEEE Electron Device Letters 39(9): 1473-1476 |
| Publisher Policy: | Reproduced under a Creative Commons License |
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