Roy, S. (2006) Intrinsic Parameter Fluctuations in Conventional MOSFETs until end of the ITRS. Journal of Physics: Conference Series, 38(1), pp. 188-191. (doi: 10.1088/1742-6596/38/1/045)
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Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Roy, Professor Scott |
Authors: | Roy, S. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | Journal of Physics: Conference Series |
Publisher: | Institute of Physics Publishing Ltd. |
ISSN: | 1742-6588 |
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