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Scott, J. , Docherty, F.T., MacKenzie, M., Smith, W. , Miller, B., Collins, C.L. and Craven, A.J. (2006) Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling. Journal of Physics: Conference Series, 26(1), pp. 223-226. (doi: 10.1088/1742-6596/26/1/053)