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Scott, J., Docherty, F.T., MacKenzie, M., Smith, W., Miller, B., Collins, C.L., and Craven, A.J. (2006) Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling. Journal of Physics: Conference Series, 26 (1). pp. 223-226. ISSN 1742-6588 (doi:10.1088/1742-6596/26/1/053)

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