Mirza, M. M. , MacLaren, D. A. , Samarelli, A., Holmes, B. M., Zhou, H., Thoms, S. , MacIntyre, D. and Paul, D. J. (2014) Determining the electronic performance limitations in top-down fabricated Si nanowires with mean widths down to 4 nm. Nano Letters, 14(11), pp. 6056-6060. (doi: 10.1021/nl5015298)
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Abstract
Silicon nanowires have been patterned with mean widths down to 4 nm using top-down lithography and dry etching. Performance-limiting scattering processes have been measured directly which provide new insight into the electronic conduction mechanisms within the nanowires. Results demonstrate a transition from 3-dimensional (3D) to 2D and then 1D as the nanowire mean widths are reduced from 12 to 4 nm. The importance of high quality surface passivation is demonstrated by a lack of significant donor deactivation, resulting in neutral impurity scattering ultimately limiting the electronic performance. The results indicate the important parameters requiring optimization when fabricating nanowires with atomic dimensions.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Mirza, Dr Muhammad M A and Zhou, Dr Haiping and MacLaren, Dr Donald and Thoms, Dr Stephen and Samarelli, Mr Antonio and Paul, Professor Douglas and Holmes, Dr Barry |
Authors: | Mirza, M. M., MacLaren, D. A., Samarelli, A., Holmes, B. M., Zhou, H., Thoms, S., MacIntyre, D., and Paul, D. J. |
Subjects: | Q Science > QC Physics |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering College of Science and Engineering > School of Physics and Astronomy |
Research Group: | Semiconductor Devices |
Journal Name: | Nano Letters |
Publisher: | American Chemical Society |
ISSN: | 1530-6984 |
ISSN (Online): | 1530-6992 |
Copyright Holders: | Copyright © 2014 American Chemical Society |
First Published: | First published in Nano Letters 14(11):6056-6060 |
Publisher Policy: | Reproduced under a Creative Commons License |
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