Torre, B., Dahiya, R.S. , Lorenzelli, L. and Cingolani, R. (2011) Atomic force microscope – an effective tool for measuring piezoelectric constants of soft materials. In: Piezo 2011 Conference, Sestriere, Italy, 28 Feb- 02 Mar 2011,
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Publisher's URL: http://www.piezoinstitute.com/piezo2011/
Abstract
No abstract available.
Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Dahiya, Professor Ravinder |
Authors: | Torre, B., Dahiya, R.S., Lorenzelli, L., and Cingolani, R. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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