Variability-aware compact model strategy for 20-nm bulk MOSFETs

Wang, X., Reid, D., Wang, L., Burenkov, A., Millar, C., Cheng, B., Lange, A., Lorenz, J., Baer, E. and Asenov, A. (2014) Variability-aware compact model strategy for 20-nm bulk MOSFETs. In: 19th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama Japan, 8-11 Sep 2014, pp. 293-296. ISBN 9781479952878

Abstract

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• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Millar, Dr Campbell and Wang, Dr Liping and Reid, Mr David and Cheng, Dr Binjie and Wang, Dr Xingsheng and Asenov, Professor Asen
• Authors: Wang, X., Reid, D., Wang, L., Burenkov, A., Millar, C., Cheng, B., Lange, A., Lorenz, J., Baer, E., and Asenov, A.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Publisher: IEEE
• ISBN: 9781479952878
• Copyright Holders: Copyright © 2014 The Authors
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher