Pottier, P., Strain, M. J. and Packirisamy, M. (2014) Integrated microspectrometer with elliptical Bragg mirror enhanced diffraction grating on silicon on insulator. ACS Photonics, 1(5), pp. 430-436. (doi: 10.1021/ph400165j)
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Publisher's URL: http://dx.doi.org/10.1021/ph400165j
Abstract
An on-chip microspectrometer is demonstrated based on a circular diffraction grating consisting of an elliptical Bragg mirror. This structure results in a highly efficient and compact device with simplified processing requirements, useful for sensing, spectroscopy, telecom demultiplexing, and optical interconnects. The computed efficiency for a realistic geometry is −0.14 dB, which represents to the best of our knowledge the highest predicted efficiency for concave diffraction gratings (echelle/echelette gratings). The first realization of the elliptical Bragg mirror diffraction grating spectrometer is presented on silicon on insulator at a wavelength of 1.55 μm. Measurements show a full device efficiency of −3.0 dB, including all in-line losses, with a band flatness of 0.4 dB over 30 nm.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Strain, Dr Michael and Pottier, Mr Pierre |
| Authors: | Pottier, P., Strain, M. J., and Packirisamy, M. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | ACS Photonics |
| Publisher: | American Chemical Society |
| ISSN: | 2330-4022 |
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