O'Shea, K.J., McGrouther, D. , Ferguson, C.A., Jungbauer, M., Hühn, S., Moshnyaga, V. and MacLaren, D.A. (2014) Fabrication of high quality plan-view TEM specimens using the focused ion beam. Micron, 66, pp. 9-15. (doi: 10.1016/j.micron.2014.04.011)
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Publisher's URL: http://dx.doi.org/10.1016/j.micron.2014.04.011
Abstract
We describe a technique using a focused ion beam instrument to fabricate high quality plan-view specimens for transmission electron microscopy studies. The technique is simple, site-specific and is capable of fabricating multiple large, >100 μm2 electron transparent windows within epitaxially-grown thin films. A film of La0.67Sr0.33MnO3 is used to demonstrate the technique and its structural and functional properties are surveyed by high resolution imaging, electron spectroscopy, atomic force microscopy and Lorentz electron microscopy. The window is demonstrated to have good thickness uniformity and a low defect density that does not impair the film’s Curie temperature. The technique will enable the study of in–plane structural and functional properties of a variety of epitaxial thin film systems.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | MacLaren, Professor Donald and McGrouther, Dr Damien and O'Shea, Miss Kerry |
Authors: | O'Shea, K.J., McGrouther, D., Ferguson, C.A., Jungbauer, M., Hühn, S., Moshnyaga, V., and MacLaren, D.A. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Micron |
Publisher: | Elsevier |
ISSN: | 0968-4328 |
ISSN (Online): | 1878-4291 |
Copyright Holders: | Copyright © 2014 Elsevier Ltd. |
First Published: | First published in Micron 66:9-15 |
Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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