Reduced density function analysis of titanium dioxide doped tantalum pentoxide

Evans, K., Bassiri, R., Maclaren, I. , Rowan, S. , Martin, I.W. , Hough, J. and Borisenko, K.B. (2012) Reduced density function analysis of titanium dioxide doped tantalum pentoxide. In: Electron Microscopy and Analysis Group Conference 2011 (EMAG 2011), Birmingham, UK, 6–9 Sep 2011, 012058. (doi: 10.1088/1742-6596/371/1/012058)

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Publisher's URL: http://dx.doi.org/10.1088/1742-6596/371/1/012058

Abstract

Future advanced gravitational wave detectors will need to be constructed using ultra low loss materials to achieve the desired sensitivity levels. Coating thermal noise which is related to mechanical loss has been determined to be a limiting factor for the sensitivity of these detectors and must be reduced. To achieve this goal, work is on going to identify the causes of coating mechanical loss. Recent experiments suggest this is micro-structural in origin, thus determining the structural features of coatings via appropriate modelling is of interest. It will be shown that through Transmission Electron Microscopy and reduced density function analysis, the local structural changes due to doping of coating materials can be identified. Furthermore by using this data as an empirical constraint for combined reverse Monte Carlo and Density Functional Theory simulations the trends seen in the data can be replicated in the modelling.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Evans, Mr Keith and Rowan, Professor Sheila and Martin, Dr Iain and MacLaren, Dr Ian and Hough, Professor James and Bassiri, Mr Riccardo
Authors: Evans, K., Bassiri, R., Maclaren, I., Rowan, S., Martin, I.W., Hough, J., and Borisenko, K.B.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Research Centre:College of Science and Engineering > School of Physics and Astronomy > Institute for Gravitational Research
Journal Name:Journal of Physics: Conference Series
ISSN:1742-6596

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