Magnetic and FMR study on CoFe2O4/ZnFe2O4 bilayers

Sahu, B.N., Sahoo, S.C., Venkataramani, N., Prasad, S., Krishnan, R., Kostylev, M. and Stamps, R.L. (2013) Magnetic and FMR study on CoFe2O4/ZnFe2O4 bilayers. IEEE Transactions on Magnetics, 49(7), pp. 4200-4203. (doi: 10.1109/TMAG.2013.2251327)

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Publisher's URL: http://dx.doi.org/10.1109/TMAG.2013.2251327

Abstract

CoFe<sub>2</sub>O<sub>4</sub>/ZnFe<sub>2</sub>O<sub>4</sub> bilayers were deposited by the pulsed laser deposition on amorphous fused quartz substrate at substrate temperature of 350°C and in oxygen pressure of 0.16 mbar. The films were studied after ex-situ annealing for 2 h in air at various temperatures up to 650°C. The magnetic properties of the bilayers were studied at 300 K and at 10 K. Ferromagnetic resonance was carried out at x-band frequencies at room temperature. It was found that as a result of annealing, the diffusion between Co ferrite and Zn ferrite starts around 350°C and leads to a large line width system having magnetization, which remains undetected by Ferromagnetic resonance.

Item Type:Articles
Additional Information:(c) 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Stamps, Professor Robert
Authors: Sahu, B.N., Sahoo, S.C., Venkataramani, N., Prasad, S., Krishnan, R., Kostylev, M., and Stamps, R.L.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:IEEE Transactions on Magnetics
Publisher:Institute of Electrical and Electronics Engineers
ISSN:0018-9464
Copyright Holders:Copyright © 2013 Institute of Electrical and Electronics Engineers
First Published:First published in IEEE Transactions on Magnetics 49)7):4200-4203
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher.

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