Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection

McCarthy, A., Krichel, N.J., Gemmell, N. R., Ren, X., Tanner, M.G., Dorenbos, S.N., Zwiller, V., Hadfield, R. and Buller, G.S. (2013) Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection. Optics Express, 21(7), pp. 8904-8915. (doi:10.1364/OE.21.008904)

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Abstract

This paper highlights a significant advance in time-of-flight depth imaging: by using a scanning transceiver which incorporated a free-running, low noise superconducting nanowire single-photon detector, we were able to obtain centimeter resolution depth images of low-signature objects in daylight at stand-off distances of the order of one kilometer at the relatively eye-safe wavelength of 1560 nm. The detector used had an efficiency of 18% at 1 kHz dark count rate, and the overall system jitter was ~100 ps. The depth images were acquired by illuminating the scene with an optical output power level of less than 250 µW average, and using per-pixel dwell times in the millisecond regime.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Tanner, Dr Michael and Gemmell, Mr Nathan and Hadfield, Professor Robert
Authors: McCarthy, A., Krichel, N.J., Gemmell, N. R., Ren, X., Tanner, M.G., Dorenbos, S.N., Zwiller, V., Hadfield, R., and Buller, G.S.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Optics Express
Publisher:Optical Society of America
ISSN:1094-4087

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