Asenov, A. et al. (2008) Meeting the design challenges of nano-CMOS electronics, design automation and test in Europe. In: Workshop on Impact of Process Variability on Design and Test, Munich, Germany, 10-14 Mar 2008,
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Cumming, Professor David and Millar, Dr Campbell and Drysdale, Dr Timothy and Roy, Professor Scott and Sinnott, Professor Richard and Asenov, Professor Asen |
| Authors: | Asenov, A., Sinnott, R.O., Millar, C., Roy, S., Cumming, D.R.S., Drysdale, T.D., Furber, S., Edwards, D., Zwolinski, M., Tyrrell, A.M., Murray, A.F., Pickles, S., and Berry, D. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering University Services > IT Services > E-Science |
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