Single photon source characterization with a superconducting single photon detector

Hadfield, R. , Stevens, M.J., Gruber, S.S., Miller, A.J., Schwall, R.E., Mirin, R.P. and Nam, S.W. (2005) Single photon source characterization with a superconducting single photon detector. Optics Express, 13(26), pp. 10846-10853. (doi: 10.1364/OPEX.13.010846)

Abstract

Superconducting single photon detectors (SSPD) based on nanopatterned niobium nitride wires offer single photon counting at fast rates, low jitter, and low dark counts, from visible wavelengths well into the infrared. We demonstrate the first use of an SSPD, packaged in a commercial cryocooler, for single photon source characterization. The source is an optically pumped, microcavity-coupled InGaAs quantum dot, emitting single photons at 902 nm. The SSPD replaces the second silicon Avalanche Photodiode (APD) in a Hanbury-Brown Twiss interferometer measurement of the source second-order correlation function, g(2)(τ). The detection efficiency of the superconducting detector system is >2 % (coupling losses included). The SSPD system electronics jitter is 170 ps, versus 550 ps for the APD unit, allowing the source spontaneous emission lifetime to be measured with improved resolution.

• Item Type: Articles
• Additional Information: This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OPEX.13.010846. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Hadfield, Professor Robert
• Authors: Hadfield, R., Stevens, M.J., Gruber, S.S., Miller, A.J., Schwall, R.E., Mirin, R.P., and Nam, S.W.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Journal Name: Optics Express
• Publisher: Optical Society of America
• ISSN: 1094-4087
• Copyright Holders: Copyright © 2005 Optical Society of America
• First Published: First published in Optics Express 13(26):10846-10853
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher