Solid immersion lens applications for nanophotonic devices

Serrels, K.A., Ramsay, E., Dalgarno, P.A., Gerardot, B., O'Connor, J., Hadfield, R.H. , Warburton, R.J. and Reid, D.T. (2008) Solid immersion lens applications for nanophotonic devices. Journal of Nanophotonics, 2(1), 021854. (doi:10.1117/1.3068652)

[img]
Preview
Text
74112.pdf - Published Version

2MB

Abstract

Solid immersion lens (SIL) microscopy combines the advantages of conventional microscopy with those of near-field techniques, and is being increasingly adopted across a diverse range of technologies and applications. A comprehensive overview of the state-of-the-art in this rapidly expanding subject is therefore increasingly relevant. Important benefits are enabled by SIL-focusing, including an improved lateral and axial spatial profiling resolution when a SIL is used in laser-scanning microscopy or excitation, and an improved collection efficiency when a SIL is used in a light-collection mode, for example in fluorescence micro-spectroscopy. These advantages arise from the increase in numerical aperture (NA) that is provided by a SIL. Other SIL-enhanced improvements, for example spherical-aberration-free sub-surface imaging, are a fundamental consequence of the aplanatic imaging condition that results from the spherical geometry of the SIL. Beginning with an introduction to the theory of SIL imaging, the unique properties of SILs are exposed to provide advantages in applications involving the interrogation of photonic and electronic nanostructures. Such applications range from the sub-surface examination of the complex three-dimensional microstructures fabricated in silicon integrated circuits, to quantum photoluminescence and transmission measurements in semiconductor quantum dot nanostructures.

Item Type:Articles
Additional Information:Copyright notice format: Copyright 2008 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Hadfield, Professor Robert
Authors: Serrels, K.A., Ramsay, E., Dalgarno, P.A., Gerardot, B., O'Connor, J., Hadfield, R.H., Warburton, R.J., and Reid, D.T.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Nanophotonics
Publisher:SPIE
ISSN:1934-2608
Copyright Holders:Copyright © 2008 2008 Society of Photo-Optical Instrumentation Engineers
First Published:First published in Journal of Nanophotonics 2(1):021854
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

University Staff: Request a correction | Enlighten Editors: Update this record