Linewidth narrowing and Purcell enhancement in photonic crystal cavities on an Er-doped silicon nitride platform

Gong, Y. et al. (2010) Linewidth narrowing and Purcell enhancement in photonic crystal cavities on an Er-doped silicon nitride platform. Optics Express, 18(3), p. 2601. (doi:10.1364/OE.18.002601)

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Abstract

Light emission at 1.54 μm from an Er-doped amorphous silicon nitride layer coupled to photonic crystal resonators at cryogenic and room temperatures and under varying optical pump powers has been studied. The results demonstrate that small mode volume, high quality factor resonators enhance Er absorption and emission rates at the cavity resonance. Time resolved measurements give 11- to 17-fold Purcell enhancement of spontaneous emission at cryogenic temperatures, and 2.4-fold enhancement at room temperature. Resonances exhibit linewidth narrowing with pump power, signifying absorption bleaching and partial inversion of the Er ions cryogenic temperatures. We estimate that 31% of Er ions are excited at the highest pump power.

Item Type:Articles
Additional Information:This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.18.002601. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Hadfield, Professor Robert
Authors: Gong, Y., Makarova, M., Yerci, S., Li, R., Stevens, M.J., Baek, B., Nam, S.W., Hadfield, R., Dorenbos, S.N., Zwiller, V., Vuckovic, J., and Dal Negro, L.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Optics Express
Publisher:Optical Society of America
ISSN:1094-4087
Published Online:25 January 2010
Copyright Holders:Copyright © 2010 Optical Society of America
First Published:First published in Optics Express 18(3):2601
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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