Measuring thermal conductivity of nanocrystalline diamond film with a scanning thermal microscope

Zhang, Y., Dobson, P.S. , Weaver, J.M.R., Rossi, S., Alomari, M., Kohn, E., Bychikhin, S. and Pogany, D. (2012) Measuring thermal conductivity of nanocrystalline diamond film with a scanning thermal microscope. In: 12th IEEE Conference on Nanotechnology, Birmingham, UK, 20-23 Aug 2012,

Abstract

This study has demonstrated that the thermal conductivity of small samples of highly thermally conductive materials can be accurately measured using scanning thermal microscopy (SThM) when calibrated using Johnson noise thermometry. A nanocrystalline diamond film sample was measured in two forms, membrane and film supported on a Si substrate. The results indicate that the membrane sample is necessary for accurate thermal measurement.

• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Weaver, Professor Jonathan and Dobson, Dr Phil and Zhang, Dr Yuan
• Authors: Zhang, Y., Dobson, P.S., Weaver, J.M.R., Rossi, S., Alomari, M., Kohn, E., Bychikhin, S., and Pogany, D.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering