Wang, L. Q., Schaffer, B., MacLaren, I. , Miao, S., Craven, A.J. and Reaney, I.M. (2012) Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO3 ceramics co-doped with Nd and Ti. Journal of Physics: Conference Series, 371, 012034. (doi: 10.1088/1742-6596/371/1/012034)
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Publisher's URL: http://iopscience.iop.org/1742-6596/371/1/012034
Abstract
High resolution scanning transmission electron microscope (HRSTEM) imaging and electron energy loss spectroscopy spectrum imaging (EELS SI) methods have been successfully applied to the analysis of (Bi<sub>0.85</sub>Nd<sub>0.15</sub>)(Fe<sub>0.9</sub>Ti<sub>0.1</sub>)O<sub>3</sub> (BNFT) ceramics. The atomic scale structural and chemistry of defects in these ceramics have been determined, leading to the discovery of a new class of Nd-rich nanoprecipitates in these ceramics.<p></p>
| Item Type: | Articles |
|---|---|
| Keywords: | 68.37.Lp Transmission electron microscopy (TEM) 77.80.-e Ferroelectricity and antiferroelectricity 75.80.+q Magnetomechanical and magnetoelectric effects, magnetostriction 79.20.Uv Electron energy loss spectroscopy 61.72.S- Impurities in crystals |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Wang, Ms Liqiu and Schaffer, Dr Bernhard and MacLaren, Dr Ian and Craven, Professor Alan |
| Authors: | Wang, L. Q., Schaffer, B., MacLaren, I., Miao, S., Craven, A.J., and Reaney, I.M. |
| Subjects: | Q Science > QC Physics Q Science > QD Chemistry T Technology > TN Mining engineering. Metallurgy |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Physics: Conference Series |
| Journal Abbr.: | J. Phys. Conf. Ser. |
| Publisher: | Institute of Physics |
| ISSN: | 1742-6588 |
| ISSN (Online): | 1742-6596 |
| Published Online: | 01 January 2012 |
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