Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

Robb, P.D., Finnie, M. and Craven, A.J. (2012) Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy. Micron, 43(10), pp. 1068-1072. (doi: 10.1016/j.micron.2012.04.018)

Abstract

The image processing technique of columnratiomapping was applied to aberration-corrected high angle annular dark field (HAADF) images of shortperiod MBE (molecular beam epitaxy) grown InAs/GaAssuperlattices. This method allowed the Indium distribution to be mapped and a more detailed assessment of interfacial quality to be made. Frozen-phonon multislice simulations were also employed to provide a better understanding of the experimental columnratio values. It was established that ultra-thin InAs/GaAs layers can be grown sufficiently well by MBE. This is despite the fact that the Indium segregated over 3–4 monolayers. Furthermore, the effect of the growth temperature on the quality of the layers was also investigated. It was demonstrated that the higher growth temperature resulted in a better quality superlattice structure.

• Item Type: Articles
• Additional Information: NOTICE: this is the author’s version of a work that was accepted for publication in Micron. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Micron 43(10), 2012. DOI: 10.1016/j.micron.2012.04.018
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Robb, Mr Paul and Craven, Professor Alan
• Authors: Robb, P.D., Finnie, M., and Craven, A.J.
• College/School: College of Science and Engineering > School of Physics and Astronomy
• Journal Name: Micron
• Publisher: Elsevier
• ISSN: 0968-4328
• ISSN (Online): 1878-4291
• Published Online: 14 May 2012
• Copyright Holders: Copyright © 2012 Elsevier
• First Published: First published in Micron 43(10):1068-1072
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher