Size effects in submicron exchange bias square elements

Vallejo-Fernandez, G. and Chapman, J.N. (2009) Size effects in submicron exchange bias square elements. Applied Physics Letters, 94(26), p. 262508. (doi: 10.1063/1.3170233)

Abstract

The behavior of submicron exchange bias square elements has been investigated for systems containing metallic polycrystalline layers. Numerical simulations using a simple theoretical model show that the exchange bias for such elements can increase and/or decrease depending on the microstructure of the antiferromagnetic layer and, in particular, its grain size distribution. The predictions are based on a granular model of exchange bias that accounts for grain cutting at the edges of the nanoelements that takes place during ion milling/etching. This leads to distributions of exchange bias fields that can be quite broad, especially in sub-250 nm elements.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Chapman, Professor John
• Authors: Vallejo-Fernandez, G., and Chapman, J.N.
• Subjects: Q Science > QC Physics
• College/School: College of Science and Engineering > School of Physics and Astronomy
• Journal Name: Applied Physics Letters
• Publisher: American Institute of Physics
• ISSN: 0003-6951
• Copyright Holders: Copyright © 2009 American Institute of Physics
• First Published: First published in Applied Physics Letters 94(26)
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher.