Simulation and analysis of solenoidal ion sources

Alderwick, A.R., Jardine, A.P., Hedgeland, H., MacLaren, D.A., Allison, W. and Ellis, J. (2008) Simulation and analysis of solenoidal ion sources. Review of Scientific Instruments, 79, p. 123301. (doi: 10.1063/1.3030858)

Abstract

We present a detailed analysis and simulation of solenoidal, magnetically confined electron bombardment ion sources, aimed at molecular beam detection. The aim is to achieve high efficiency for singly ionized species while minimizing multiple ionization. Electron space charge plays a major role and we apply combined ray tracing and finite element simulations to determine the properties of a realistic geometry. The factors controlling electron injection and ion extraction are discussed. The results from simulations are benchmarked against experimental measurements on a prototype source.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: MacLaren, Professor Donald
• Authors: Alderwick, A.R., Jardine, A.P., Hedgeland, H., MacLaren, D.A., Allison, W., and Ellis, J.
• Subjects: Q Science > QC Physics
• College/School: College of Science and Engineering > School of Physics and Astronomy
• Journal Name: Review of Scientific Instruments
• Publisher: American Institute of Physics
• ISSN: 0034-6748
• Copyright Holders: Copyright © 2008 American Institute of Physics
• First Published: First published in Review of Scientific Instruments
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher.