Multiple reflections in an approximately parallel plate

Soler, F.J.P. (1997) Multiple reflections in an approximately parallel plate. Optics Communications, 139(4-6), pp. 165-169. (doi: 10.1016/S0030-4018(97)00138-7)

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Measurements of the fraction of light reflected and transmitted through a parallel plate of dielectric material can be used to determine its refractive index and absorption coefficient. If the surfaces of the plate are exactly parallel, the amplitude of the electromagnetic waves reflected and transmitted can be derived as the interference of the partial waves at each interface, resulting in a generalization of the Airy formulas for an absorbing medium. However, in the case of a thick plate in which the surfaces are not exactly parallel (the variation of thickness in the plate is much larger than the incoming wavelength), or in the case of non-monochromatic light, the partial waves do not add up in a coherent manner. In this case, the fraction of light reflected and transmitted can be extracted from the exactly parallel case by performing an average over all possible phase shifts. The simple formulas derived from this treatment can then be used to determine simultaneously the refractive index and absorption coefficient of a dielectric material.

Item Type:Articles
Glasgow Author(s) Enlighten ID:Soler, Professor Paul
Authors: Soler, F.J.P.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Optics Communications

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