Chen, Q., Chitnis, D., Walls, K., Drysdale, T.D., Collins, S. and Cumming, D.R.S. (2012) CMOS photodetectors integrated with plasmonic color filters. IEEE Photonics Technology Letters, 24(3), pp. 197-199. (doi: 10.1109/LPT.2011.2176333)
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Publisher's URL: http://dx.doi.org/10.1109/LPT.2011.2176333
Abstract
A single-pixel plasmonic complementary metal oxide semiconductor (CMOS) photo sensor consisting of a plasmonic color filter integrated on a CMOS photodiode was fabricated using electron beam lithography and dry etch. The photocurrent measurement results confirmed the three primary color filtering responses that could be achieved in a single layer of nanostructured aluminium film. Finite-difference time-domain simulation demonstrated a good agreement of the reflection spectra with the measured result. This research can lead to the development of advanced CMOS image sensors with low cost and low crosstalk.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Cumming, Professor David and Walls, Miss Kirsty and Drysdale, Dr Timothy and Chen, Dr Qin |
Authors: | Chen, Q., Chitnis, D., Walls, K., Drysdale, T.D., Collins, S., and Cumming, D.R.S. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | IEEE Photonics Technology Letters |
Publisher: | IEEE |
ISSN: | 1041-1135 |
Published Online: | 16 November 2011 |
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