Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

Ding, W., Gorbach, A.V., Wadsworth, W.J., Knight, J.C., Skryabin, D.V., Strain, M., Sorel, M. and De La Rue, R.M. (2010) Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique. Optics Express, 18(25), pp. 26625-26630. (doi: 10.1364/OE.18.026625)

Abstract

We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive waves emitted by solitons into the wavelength range of normal group velocity dispersion.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Sorel, Professor Marc and De La Rue, Professor Richard and Strain, Dr Michael
• Authors: Ding, W., Gorbach, A.V., Wadsworth, W.J., Knight, J.C., Skryabin, D.V., Strain, M., Sorel, M., and De La Rue, R.M.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Journal Name: Optics Express
• Publisher: Optical Society of America
• ISSN: 1094-4087
• ISSN (Online): 1094-4087