Near-simultaneous core- and low-loss EELS spectrum-imaging in the STEM using a fast beam switch

Thomas, P., Scott, J. , MacKenzie, M., McFadzean, S., Wilbrink, J. and Craven, A. (2006) Near-simultaneous core- and low-loss EELS spectrum-imaging in the STEM using a fast beam switch. Microscopy and Microanalysis, 12(S02), pp. 1362-1363. (doi: 10.1017/S1431927606065512)

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Scott, Dr Jamie and MacKenzie, Dr Maureen and Craven, Professor Alan and McFadzean, Dr Sam
Authors: Thomas, P., Scott, J., MacKenzie, M., McFadzean, S., Wilbrink, J., and Craven, A.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Research Group:Solid State Physics
Journal Name:Microscopy and Microanalysis
Publisher:Published for the Microscopy Society of America by Cambridge University Press
ISSN:1431-9276
ISSN (Online):1435-8115
Published Online:31 July 2006
Copyright Holders:Copyright © 2006 Microscopy Society of America
First Published:First published in Microscopy and Microanalysis 12(S02):1362-1363
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
350671Chemistry, structure and bonding in high-k gate oxide stacksAlan CravenEngineering & Physical Sciences Research Council (EPSRC)GR/S44280/01Physics and Astronomy
358573Sub 100nm 111-V MOSFET's for Digital ApplicationsIain ThayneEngineering & Physical Sciences Research Council (EPSRC)GR/S61218/01Electronic and Nanoscale Engineering