Thomas, P., Scott, J. , MacKenzie, M., McFadzean, S., Wilbrink, J. and Craven, A. (2006) Near-simultaneous core- and low-loss EELS spectrum-imaging in the STEM using a fast beam switch. Microscopy and Microanalysis, 12(S02), pp. 1362-1363. (doi: 10.1017/S1431927606065512)
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Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Scott, Dr Jamie and MacKenzie, Dr Maureen and Craven, Professor Alan and McFadzean, Dr Sam |
Authors: | Thomas, P., Scott, J., MacKenzie, M., McFadzean, S., Wilbrink, J., and Craven, A. |
Subjects: | Q Science > QC Physics |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Research Group: | Solid State Physics |
Journal Name: | Microscopy and Microanalysis |
Publisher: | Published for the Microscopy Society of America by Cambridge University Press |
ISSN: | 1431-9276 |
ISSN (Online): | 1435-8115 |
Published Online: | 31 July 2006 |
Copyright Holders: | Copyright © 2006 Microscopy Society of America |
First Published: | First published in Microscopy and Microanalysis 12(S02):1362-1363 |
Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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