Brownlie, C., McVitie, S., Chapman, J.N. and Wilkinson, C.D.W. (2006) Lorentz microscopy studies of domain wall trap structures. Journal of Applied Physics, 100(3), 033902. (doi: 10.1063/1.2227263)
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Publisher's URL: http://dx.doi.org/10.1063/1.2227263
Abstract
Domain wall traps of varying geometry have been studied using Lorentz microscopy in a transmission electron microscope. Electron beam lithography and lift-off were used to fabricate the elements whose shape allowed the formation of a head-to-head domain structure in the central section. Previous micromagnetic simulations have shown that different head-to-head configurations are possible depending on the width and thickness of the strip. In the majority of our in situ magnetizing experiments a vortex domain wall configuration was nucleated. This could be moved reproducibly between the ends of the element under fields of a few tens of oersted.
Item Type: | Articles |
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Keywords: | transmission electron microscopy, electron beam lithography, magnetic domain walls, micromagnetics |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | McVitie, Professor Stephen and Chapman, Professor John |
Authors: | Brownlie, C., McVitie, S., Chapman, J.N., and Wilkinson, C.D.W. |
Subjects: | Q Science > QC Physics |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Journal of Applied Physics |
Publisher: | American Institute of Physics |
ISSN: | 0021-8979 |
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