Payraudeau, N., McGrouther, D. and O'Kelly, K. (2011) Quantification of subsurface damage in a brittle insulating ceramic by 3D FIB tomography. Microscopy and Microanalysis, 17(2), pp. 240-245.
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Abstract
In this study, we present a fully automated method to investigate and reconstruct the threedimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | McGrouther, Dr Damien |
Authors: | Payraudeau, N., McGrouther, D., and O'Kelly, K. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Microscopy and Microanalysis |
Publisher: | Published for the Microscopy Society of America by Cambridge University Press |
ISSN: | 1431-9276 |
ISSN (Online): | 1435-8115 |
Published Online: | 04 March 2011 |
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