Quantification of subsurface damage in a brittle insulating ceramic by 3D FIB tomography

Payraudeau, N., McGrouther, D. and O'Kelly, K. (2011) Quantification of subsurface damage in a brittle insulating ceramic by 3D FIB tomography. Microscopy and Microanalysis, 17(2), pp. 240-245.

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Abstract

In this study, we present a fully automated method to investigate and reconstruct the threedimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McGrouther, Dr Damien
Authors: Payraudeau, N., McGrouther, D., and O'Kelly, K.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Microscopy and Microanalysis
Publisher:Published for the Microscopy Society of America by Cambridge University Press
ISSN:1431-9276
ISSN (Online):1435-8115
Published Online:04 March 2011

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