Graham, D., Bradley, D., Roy, S., Strid, P. and Rodriguez-Salazar, F. (2008) Design for reliability: an analysis of logical masking on transient faults. In: IEEE Workshop on Silicon Errors in Logic - System Effects, Austin, TX, USA, 26-27 March 2008,
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Roy, Professor Scott and Rodriguez-Salazar, Dr Fernando |
| Authors: | Graham, D., Bradley, D., Roy, S., Strid, P., and Rodriguez-Salazar, F. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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