Loos, J., van Duren, J., Morrissey, F. and Janssen, R. (2002) The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass. Polymer, 43(26), pp. 7493-7496.
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Item Type: | Articles |
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Additional Information: | Article |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Loos, Professor Joachim |
Authors: | Loos, J., van Duren, J., Morrissey, F., and Janssen, R. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Polymer |
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