The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass

Loos, J., van Duren, J., Morrissey, F. and Janssen, R. (2002) The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass. Polymer, 43(26), pp. 7493-7496.

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Item Type:Articles
Additional Information:Article
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Loos, Professor Joachim
Authors: Loos, J., van Duren, J., Morrissey, F., and Janssen, R.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Polymer

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