Alexeev, A., Loos, J. and Koetse, M. (2006) Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy. Ultramicroscopy, 106(3), pp. 191-199. (doi: 10.1016/j.ultramic.2005.07.003)
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| Item Type: | Articles |
|---|---|
| Additional Information: | Article |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Loos, Professor Joachim |
| Authors: | Alexeev, A., Loos, J., and Koetse, M. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Ultramicroscopy |
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