Loos, J. and Tian, M. (2002) Low voltage scanning electron microscopy and atomic force microscopy: state-of-the-art microscopy techniques for investigations of polymer single crystals. E-Polymers,
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| Item Type: | Articles |
|---|---|
| Additional Information: | Article |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Loos, Professor Joachim |
| Authors: | Loos, J., and Tian, M. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | E-Polymers |
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