Anaxagoras, T., Kent, P., Allinson, N., Turchetta, R.,, Pickering, T., Maneuski, D., Blue, A. and O'Shea, V. (2010) eLeNA: a parametric CMOS Active-Pixel Sensor for the evaluation of reset noise reduction architectures. IEEE Transactions on Electron Devices, 57(9), pp. 2163-2175. (doi: 10.1109/TED.2010.2052418)
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Abstract
We present a novel complementary metal-oxide-semiconductor (CMOS) active-pixel sensor imager that incorporates different reset schemes to achieve lower reset noise levels. The sensor, eLeNA, features a 448 × 512 array with a pixel pitch of 15 μm, fabricated using a 0.18- μm CMOS process. Fourteen sections and five different reset methods were employed. Without using pinned diodes, we implanted structures for correlated double sampling. A noise of 6 e- is measured with a conversion gain of 49 μV/e-. We will discuss various applications for the reset method that achieved the best overall performance, considering leakage current and read noise.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Maneuski, Dr Dima and Blue, Dr Andrew and O'Shea, Professor Val |
Authors: | Anaxagoras, T., Kent, P., Allinson, N., Turchetta, R.,, Pickering, T., Maneuski, D., Blue, A., and O'Shea, V. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | IEEE Transactions on Electron Devices |
Publisher: | Institute of Electrical and Electronics Engineers |
ISSN: | 0018-9383 |
Published Online: | 01 September 2010 |
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