Kharintsev, S., Hoffmann, G., Dorozhkin, P., de With, G. and Loos, J. (2007) Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging. Nanotechnology, 18(31), (doi: 10.1088/0957-4484/18/31/315502)
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| Item Type: | Articles |
|---|---|
| Additional Information: | Article |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Loos, Professor Joachim |
| Authors: | Kharintsev, S., Hoffmann, G., Dorozhkin, P., de With, G., and Loos, J. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Nanotechnology |
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