Lu, K., Sourty, E. and Loos, J. (2010) Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems. Journal of Electron Microscopy, 59, S39-S44. (doi: 10.1093/jmicro/dfq048)
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| Item Type: | Articles |
|---|---|
| Additional Information: | Proceedings Paper |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Loos, Professor Joachim |
| Authors: | Lu, K., Sourty, E., and Loos, J. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Electron Microscopy |
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