Roy, S. (2010) Trends in the influence of atomic fluctuations on the operation and reliability of nanoscale devices and circuits. In: HIPEAC Task Force on Reliability and Availability, Edinburgh, UK, 3-5 May 2010,
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Roy, Professor Scott |
| Authors: | Roy, S. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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