Yin, H. , McPhee, G. and Dobson, P. (2009) Micro/nanoengineering and AFM for cellular sensing. In: Bowen, W.R. and Hilal, N. (eds.) Atomic Force Microscopy in Process Engineering: Introduction to AFM for Improved Processes and Products. Butterworth-Heinemann: Oxford, UK. ISBN 9781856175173
Full text not currently available from Enlighten.
Item Type: | Book Sections |
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Status: | Published |
Glasgow Author(s) Enlighten ID: | Yin, Professor Huabing and Dobson, Dr Phil |
Authors: | Yin, H., McPhee, G., and Dobson, P. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering College of Science and Engineering > School of Engineering > Biomedical Engineering |
Publisher: | Butterworth-Heinemann |
ISBN: | 9781856175173 |
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