Imaging polymer systems with high-angle annular dark field scanning transmission electron microscopy (HAADF−STEM)

Loos, J., Sourty, E., Lu, K., de With, G. and v. Bavel, S. (2009) Imaging polymer systems with high-angle annular dark field scanning transmission electron microscopy (HAADF−STEM). Macromolecules, 42(7), pp. 2581-2586. (doi: 10.1021/ma8026589)

Full text not currently available from Enlighten.

Abstract

We have analyzed the nanoscale organization of various polymer systems by utilizing high-angle annular dark field scanning transmission electron microscopy (HAADF−STEM). All systems under investigation are purely carbon based; in some cases staining was used for comparison with conventional transmission electron microscopy (CTEM) imaging. For contrast creation we have applied density differences rather than differences in elemental composition of the materials. Because HAADF−STEM is an incoherent imaging technique, which provides images easy to interpret due to the lack of phase contrast, the high signal-to-noise ratio and the linearity of the signal intensity, imaging artifacts are substantially reduced and additional information on the nanoscale organization of polymer materials is obtained that is not accessible by CTEM. Exemplary, we present HAADF−STEM results form four different polymer systems—a rubber blend, a carbon black filled conductive nanocomposite, a functional blend as applied for the photoactive layer of a polymer solar cell, and semicrystalline polyethylene—and discuss critically contrast origin and the advantages of HAADF−STEM imaging for morphology characterization of polymer systems.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Loos, Professor Joachim
Authors: Loos, J., Sourty, E., Lu, K., de With, G., and v. Bavel, S.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Macromolecules
Publisher:American Chemical Society
ISSN:0024-9297
ISSN (Online):1520-5835
Published Online:10 March 2009

University Staff: Request a correction | Enlighten Editors: Update this record