Asenov, A. (2010) Statistical nano CMOS variability and its impact on SRAM. In: Singhee, A. and Rutenbar, R.A. (eds.) Extreme Statistics in Nanoscale Memory Design. Springer, pp. 17-50. ISBN 9781441966056 (doi: 10.1007/978-1-4419-6606-3_3)
Full text not currently available from Enlighten.
| Item Type: | Book Sections |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen |
| Authors: | Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | Extreme Statistics in Nanoscale Memory Design |
| Publisher: | Springer |
| ISBN: | 9781441966056 |
University Staff: Request a correction | Enlighten Editors: Update this record
Deposit and Record Details
Deposit and Record Details