Combining Process and Statistical Variability in the Evaluation of the Effectiveness of Corners in Digital Circuit Parametric Yield Analysis

Asenov, P., Kamsani, N.A., Reid, D., Millar, C., Roy, S. and Asenov, A. (2010) Combining Process and Statistical Variability in the Evaluation of the Effectiveness of Corners in Digital Circuit Parametric Yield Analysis. In: ESSDERC 2010, Sevilla, 13-17 September,

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Millar, Dr Campbell and Reid, Mr David and Asenov, Mr Plamen and Roy, Professor Scott and Asenov, Professor Asen
Authors: Asenov, P., Kamsani, N.A., Reid, D., Millar, C., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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