Asenov, P., Kamsani, N.A., Reid, D., Millar, C., Roy, S. and Asenov, A. (2010) Combining Process and Statistical Variability in the Evaluation of the Effectiveness of Corners in Digital Circuit Parametric Yield Analysis. In: ESSDERC 2010, Sevilla, 13-17 September,
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Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Millar, Dr Campbell and Reid, Mr David and Asenov, Mr Plamen and Roy, Professor Scott and Asenov, Professor Asen |
Authors: | Asenov, P., Kamsani, N.A., Reid, D., Millar, C., Roy, S., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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