Thomas, S.M., Prest, M.J., Whall, T.E., Beer, C.S., Leadley, D.R., Parker, E.H.C., Watling, J., Lander, R.J.P. and Vellianitis, G. (2010) Low temperature effective mobility measurements and modelling of high-k gated Si n-MOS and p-MOS devices. In: 11th International Conference on Ultimate Integration Silicon (ULIS), Glasgow, UK, 2010,
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Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Watling, Dr Jeremy |
Authors: | Thomas, S.M., Prest, M.J., Whall, T.E., Beer, C.S., Leadley, D.R., Parker, E.H.C., Watling, J., Lander, R.J.P., and Vellianitis, G. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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