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Impact of input slew rate on statistical timing and power dissipation variability in nanoCMOS

Dideban, D., Cheng, B., Moezi, N., Kamsani, N.A., Millar, C., Roy, S. and Asenov, A. (2010) Impact of input slew rate on statistical timing and power dissipation variability in nanoCMOS. In: 11th International Conference on Ultimate Integration on Silicon, Glasgow, Scotland, 17-19 Mar 2010,

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Publisher's URL: http://www.ulisconference.org/programme.php


Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Millar, Dr Campbell and Cheng, Dr Binjie and Roy, Professor Scott and Asenov, Professor Asen
Authors: Dideban, D., Cheng, B., Moezi, N., Kamsani, N.A., Millar, C., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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