Post-Process Removal of Spurious Fabry-Perot Oscillations Caused by Cleaved Waveguide-Ends

Gnan, M., Bellanca, G. and De La Rue, R.M. (2009) Post-Process Removal of Spurious Fabry-Perot Oscillations Caused by Cleaved Waveguide-Ends. Journal of Lightwave Technology, 27(5-8), pp. 500-510. (doi:10.1109/JLT.2008.2004593)

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Testing of integrated (guided-wave) optical component that uses cleaved facets for input/output coupling has to deal with spurious Fabry-Perot cavity effects that can interfere heavily with observation and measurement of the behavior of the device. This paper demonstrates a technique that takes advantage of such interference for the reconstruction of the complete characteristics of a generic component. By studying a theoretical model of the system, a post-process computational tool is developed and verified through numerical testing. Starting from a single transmittance data set, the amplitude and phase of the transmission and reflection coefficients are reconstructed with considerable accuracy. Initial experimental testing demonstrates consistency in reconstructing the behavior of a real device

Item Type:Articles
Keywords:Behavior Cavity component device Fabry-Perot resonators gratings INTERFERENCE MODE model optical optical waveguide components OSCILLATION OSCILLATIONS REAL RECONSTRUCTION scattering matrices silicon on insulator technology silicon-on-insulator SLOW-LIGHT system transmission transmittance
Glasgow Author(s) Enlighten ID:De La Rue, Professor Richard
Authors: Gnan, M., Bellanca, G., and De La Rue, R.M.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Lightwave Technology

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