Strain enhancement during annealing of GaAsN alloys

Zhuang, Q.D., Krier, A. and Stanley, C.R. (2007) Strain enhancement during annealing of GaAsN alloys. Journal of Applied Physics, 101(10), p. 103536.

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Publisher's URL: http://link.aip.org/link/?JAPIAU/101/103536/1

Abstract

We have investigated the effect of rapid thermal annealing (RTA) on the optical and structural properties of GaAsN alloys using photoluminescence (PL) and double-crystal x-ray diffraction. We observe a significant anomalous strain enhancement during RTA and a blueshift of the PL peak energy accompanied by a reduction in the emission linewidth. The PL features are attributed to an improvement in the homogeneity of the alloy, and the strain enhancement reflects a change in N-related complexes during annealing. Based on a defect model, an interstitial nitrogen concentration of 1.8×1019 cm−3 is deduced prior to annealing.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Stanley, Professor Colin
Authors: Zhuang, Q.D., Krier, A., and Stanley, C.R.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
University Centres > Glasgow Materials Research Initiative
Journal Name:Journal of Applied Physics
ISSN:0021-8979

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