Ning, Z., Sneyders, Y., Vanderbauwhede, W. , Gillon, R., Tack, M. and Raes, P. (2001) A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. Microelectronics Reliability, 41(12), pp. 1939-1945. (doi: 10.1016/S0026-2714(01)00100-7)
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Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Vanderbauwhede, Professor Wim |
Authors: | Ning, Z., Sneyders, Y., Vanderbauwhede, W., Gillon, R., Tack, M., and Raes, P. |
Subjects: | Q Science > QA Mathematics > QA75 Electronic computers. Computer science |
College/School: | College of Science and Engineering > School of Computing Science |
Journal Name: | Microelectronics Reliability |
ISSN: | 0026-2714 |
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