Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

Johnson, N.P., Khokhar, A.Z., Chong, H.M.H., De La Rue, R.M. and McMeekin, S. (2006) Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon. Electronics Letters, 42(19), pp. 1117-1119. (doi: 10.1049/el:20062212)

Abstract

The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Johnson, Dr Nigel and De La Rue, Professor Richard
• Authors: Johnson, N.P., Khokhar, A.Z., Chong, H.M.H., De La Rue, R.M., and McMeekin, S.
• Subjects: Q Science > QC Physics
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Journal Name: Electronics Letters
• Publisher: The Institution of Engineering & Technology
• ISSN: 0013-5194
• ISSN (Online): 1350-911X
• Copyright Holders: Copyright © 2006 Institution of Engineering and Technology
• First Published: First published in Electronics Letters 42(19):1117-1119
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher.