MacLaren, D.A. , Holst, B., Riley, D.J. and Allison, W. (2003) Focusing elements and design considerations for a scanning helium microscope (SHeM). Surface Review and Letters, 10(2-3), pp. 249-255. (doi: 10.1142/S0218625X03005062)
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Abstract
We describe recent developments in the fabrication of an atom-optical mirror for focusing thermal helium atoms. A bent silicon crystal is, in principle, capable of high intensity, low aberration helium reflection; manipulation of the mirror's macrostructure minimizes optical aberrations in the device whilst chemical control over the mirror's microstructure ensures high intensity reflection. Incorporation of the atom mirror into a novel Scanning Helium Microscope (SHeM) is outlined, in the context of surface-structural studies. In particular, we refer to the expected operation, contrast mechanisms and resolution of such an instrument.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | MacLaren, Professor Donald |
| Authors: | MacLaren, D.A., Holst, B., Riley, D.J., and Allison, W. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Surface Review and Letters |
| ISSN: | 0218-625X |
| ISSN (Online): | 1793-6667 |
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