Cheng, B.J., Dideban, D., Moezi, N., Millar, C., Roy, G., Wang, X., Roy, S. and Asenov, A. (2010) Statistical-variability compact-modeling strategies for BSIM4 and PSP. IEEE Design and Test of Computers, 27(2), pp. 26-35. (doi: 10.1109/MDT.2010.53)
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Abstract
The strategy to generate statistical model parameters is essential for variability-aware design. Based on 3D atomistic simulation results, this article evaluates the accuracy of statistical parameter generation for two industry-standard compact device models.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Millar, Dr Campbell and Roy, Dr Gareth and Cheng, Dr Binjie and Roy, Professor Scott and Wang, Dr Xingsheng and Asenov, Professor Asen |
| Authors: | Cheng, B.J., Dideban, D., Moezi, N., Millar, C., Roy, G., Wang, X., Roy, S., and Asenov, A. |
| Subjects: | Q Science > QA Mathematics > QA75 Electronic computers. Computer science |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | IEEE Design and Test of Computers |
| ISSN: | 0740-7475 |
| ISSN (Online): | 1558-1918 |
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